EMC assessment at chip and PCB level: Use of the ICEM model for jitter analysis in an integrated PLL

IEEE Transactions on Electromagnetic Compatibility

Volumn 49, Issue 1, 2007, Pages 182-191

  Levant, Jean Luc ^a   Ramdani, Mohamed ^b   Perdriau, Richard ^b   Drissi, M'hamed ^c  

^a ATMEL Nantes SA   (France)

^b ESEO   (France)

^c INSA DE RENNES   (France)

Author keywords

Application specific integrated circuit (ASIC); Decoupling; Integrated circuit electromagnetic model (ICEM); Jitter; Modeling; Phase locked loop (PLL); Prediction; Simulation

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTROMAGNETIC WAVE EMISSION; JITTER; MATHEMATICAL MODELS; PHASE LOCKED LOOPS; PRINTED CIRCUIT BOARDS;

AUTROCOMPATIBILITY; DECOUPLING; INTEGRATED CIRCUIT ELECTROMAGNETIC MODEL;

ELECTROMAGNETIC COMPATIBILITY;

EID: 33947603901     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2006.888181     Document Type: Article

References (6)

1. IEC EMC Task Force (2001, Nov.). IEC62014-3. Integrated circuit electromagnetic model. Draft Tech. Rep., IEC. [Online]. Available: http://www.iec.ch
2. J. L. Levant, M. Ramdani, E. Tinlot, and R. Perdriau, "ICEM modelling of microcontroller current activity," Microelectron. J., vol. 35, no. 6, pp. 501-507, Jun. 2004.
3. IEC EMC Task Force (2000, Nov.). IEC61967-4. Measurement of conducted emission, 1 ohm/150 ohm method. Draft Tech. Rep., IEC. [Online]. Available: http://www.iec.ch
4. IEC EMC Task Force (2001, Jul.). IEC61967-2. Measurement of electromagnetic emissions, 150 kHz to 1 GHz - measurement of radiated emissions, TEM-cell method and wideband TEM-cell method (150 kHz to 8 GHz). Draft Tech. Rep., IEC. [Online]. Available: http://www.iec.ch
5. J. L. Levant, M. Ramdani, and R. Perdriau, "Power supply network modeling," in Proc. EMC Compo., Nov. 2002, pp. 75-78.
6. D. Adar and S. Ben-Yaakov, "Generic average modeling and simulation of discrete controllers," in Proc. IEEE Appl. Power Electron. Conf., 2001, pp. 535-541.