Simulation of charge breeding for trapped ions

Journal of Physics: Conference Series

Volumn 58, Issue 1, 2007, Pages 443-446

  Becker, R ^a   Kester, O ^b   Stoehlker, Th ^b  

^a GOETHE UNIVERSITY   (Germany)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947411966     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/58/1/102     Document Type: Article

References (8)

1. Donets E D 1989 The Physics and Technology of Ion Sources I G Brown (John Wiley & Sons, New York) p 245
2. Becker R 1995 Handbook of Ion Sources B Wolf (CRC-Press, Boca Raton, NY, London, Tokyo) p 157
3. Singh P 2001 BNL, private communication 2001
4. Becker R and Kleinod M 1994 Space charge compensation of electron beams by thermal ions and the production of highly charged ions in EBIS and EBIT Rev. Sci. Instrum. 65 1063
5. Tawara H and Kato T 1985 Ionization Cross Sections of Atoms and Ions by Electron Impact Inst. Plasma Physics (Nagoya) IPPJ-AM-37
6. Lotz W 1967 An Empirical Formula for the Electron-Impact Ionization Cross-Section Z.Phys. 206 205
7. Becker R, Brinzanescu O and Stöhlker Th 2001 Limitation of EBIS/T Ion Yield by Radiative Recombination AIP Conf. Proc. vol 572 p 119
8. Müller A and Salzborn E 1977 Scaling of cross-sections for multiple electron transfer to highly charged ions colliding with atoms and molecules Phys. Lett. 62A 391