In situ probing of dynamic nanostructural change of electrodeposits in the course of oscillatory growth using SERS

Journal of Physical Chemistry C

Volumn 111, Issue 8, 2007, Pages 3216-3219

  Fukami, Kazuhiro ^a   Nakanishi, Shuji ^a,b   Sawai, Yoshitaka ^c   Sonoda, Kentaro ^a   Murakoshi, Kei ^c   Nakato, Yoshihiro ^b  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODEPOSITION; INTERFACES (MATERIALS); NANOCRYSTALS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY;

NANOSTRUCTURAL CHANGE; OSCILLATORY GROWTH; SURFACE-ENHANCED RAMAN SCATTERING (SERS);

THIN FILMS;

EID: 33947408136     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0684776     Document Type: Article

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26. 4/air interface also showed the 2D growth of the deposits along the interface in the absence of surfactant (unpublished result).