Highly charged ion beam diagnostics at the mVINIS ion source

Journal of Physics: Conference Series

Volumn 58, Issue 1, 2007, Pages 423-426

  Popeskov, B ^a   Milivojevic M ^a   Cveti, J ^a   Nedeljkovic T ^b   Draganic I ^b  

^a Faculty of Electrical Engineering   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947406859     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/58/1/097     Document Type: Article

References (8)

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5. Draganić I et al 2006 Rev. Sci. Instrum. 77 03A306
6. 2003 SANYO color CCD camera VCC-5984 instruction manual, SANYO Electric Co., Ltd.
7. Tech J L 1963 J. Res. NBS (U. S.) 67a 505
8. Risberg P 1956 Ark. Fys. 10 583