A variation of the F-test for determining statistical relevance of particular parameters in EXAFS fits

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 129-131

  Downward, L ^a,b   Booth, C H ^b   Lukens, W W ^b   Bridges, F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

EXAFS; F test; Hamilton test

Indexed keywords

EID: 33947401443     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644450     Document Type: Conference Paper

References (15)

1. W. C. Hamilton, Acta Cryst. 18, 502 (1965).
2. A. Bacchi, V. S. Lamzin, and K. S. Wilson, Acta Cryst. D52, 641 (1996).
3. R. W. Joyner, K. J. Martin, and P. Meehan, J. Phys. C: Solid State Phys. 20, 4005 (1987).
4. J. Freund, Phys. Lett. A 157, 256 (1991).
5. A. Michalowicz, K. Provost, S. Lamelle, A. Mimouni, and G. Vlaic, J. Synchrotron Rad. 6, 233 (1999).
6. K. V. Klementev, Nuclear Instruments and Methods in Physics Research A 470, 310 (2001).
7. F. Piazza, J. Phys.: Condens. Matter 14, 11623 (2002).
8. P. Eisenberger, and G. S. Brown, Solid State Commun. 29, 481 (1979).
9. P. R. Bevington, and D. K. Robinson, Data Reduction and Error Analysis for the Physical Sciences, McGraw-Hill, 2003, third ed.
10. G. G. Li, F. Bridges, and C. H. Booth, Phys. Rev. B 52, 6332 (1995), URL http://lise.lbl.gov/RSXAP.
11. A. L. Ankudinov, B. Ravel, J. J. Rehr, and S. D. Conradson, Phys. Rev. B 58, 7565 (1998).
12. W. W. Lukens, J. J. Bucher, D. K. Shuh, and N. M. Edelstein, Environ. Sci. Technol. 39, 8064 (2005).
13. A. Müller, R. Jostes, and F. A. Cotton, Angew. Chem. Int. Ed. Engl. 19, 875 (1980).
14. E. A. Stern, Phys. Rev. B 48, 9825 (1993).
15. M. Newville, J. Synchrotron Rad. 8, 322 (2001).