An ion chamber dedicated to carbon NEXAFS: Removal of high-order x-rays and reliable flux measurement

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 920-922

  Fan, Liang Jen ^a   Yang, Yaw Wen ^a   Lee, Kaidee ^a  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

Carbon K edge; Ion chamber; NEXAFS technique; X ray intensity monitor

Indexed keywords

EID: 33947392943     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644705     Document Type: Conference Paper

References (4)

1. J. Stöhr, NEXAFS Spectroscopy (Springer-Verlag, Berlin, 1992).
2. Silicon photodiode with model number AXUV 100, available from International Radiation Detector Inc.
3. X-ray transmission data were obtained from Eric Gullikson's website at the Advanced Light Source web site at University of California, Berkeley: http://www-cxro.lbl.gov/optical_constants/filter2.html.
4. Titanium foils were purchased from Lebow Company, Goleta, CA.