Embedded DRAM technologies

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 1997, Pages 33-36

  Ishiuchi, H ^a   Yoshida, T ^a   Takato, H ^a   Tomioka, K ^a   Matsuo, K ^a   Momose, H ^a   Sawada, S ^a   Yamazaki, K ^a   Maeguchi, K ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS MEMORY (DRAM);

BANDWIDTH; COMPUTER ARCHITECTURE; INTEGRATED CIRCUIT MANUFACTURE;

RANDOM ACCESS STORAGE;

EID: 33947379903     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)