Micro-soft x-ray spectroscopy with the LUCIA beamline

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 852-857

  Lagarde, P ^a   Flank, A M ^a   Vantelon, D ^a   Janousch, M ^b  

^a SYNCHROTRON SOLEIL   (France)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Environment; High pressure; High temperature; X ray micro spectroscopy

Indexed keywords

EID: 33947372942     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644683     Document Type: Conference Paper

References (5)

1. A.-M. Flank, G. Cauchon, P. Lagarde, S. Bac, M. Janousch, R. Wetter, J.-M. Dubuisson, M. Idir, F. Langlois, T. Moreno and D. Vantelon NIM B 246, 269-274 (2006).
2. G.I. Meijer U. Staub, M. Janousch, S.L. Johnson, B. Delley and T. Neisius Phys. Rev. B 72, 155102 (2005).
3. J.P. Itié, B. Couzinet, A. Polian, A.-M. Flank and P. Lagarde Europhys. Lett. 74 (4), 706-711 (2006).
4. P. Richet and P. Gillet J. Appl. Phys. 74: 5451-5456 (1993).
5. S. Reguer, P. Dillmann, F. Mirambet, J. Susini and P. Lagarde Applied Physics A: Materials Science & Processing, 1-5 (2006).