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Volumn 882, Issue , 2007, Pages 893-895
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XAFS at the Canadian light source
a,b
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Author keywords
Beamline; Diffraction; Microprobe; Synchrotron; XAFS
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Indexed keywords
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EID: 33947369402
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.2644695 Document Type: Conference Paper |
Times cited : (17)
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References (7)
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