Complex permittivity measurements using a quasi-optical multistate reflectometer

1998 IEEE 6th International Conference on Terahertz Electronics, THz 1998 - Proceedings

Volumn 1998-September, Issue , 1998, Pages 163-165

  Thompson, D ^a   Miles, R E ^a   Pollard, R D ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Multistate reflectometer; Permittivity measurements

Indexed keywords

PERMITTIVITY; REFLECTOMETERS; UNCERTAINTY ANALYSIS; WAVEGUIDES;

COMPLEX PERMITTIVITY; COMPLEX PERMITTIVITY MEASUREMENT; FREE SPACE MEASUREMENTS; FREE SPACES; HIGH-FREQUENCY DIELECTRICS; MULTI-STATE; QUASI-OPTICAL;

PERMITTIVITY MEASUREMENT;

EID: 33947326781     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/THZ.1998.731693     Document Type: Conference Paper

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