Hierarchical Bayesian statistical analysis for a calibration experiment

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 6, 2006, Pages 2165-2171

  Landes, Reid D ^a   Loutzenhiser, Peter G ^b   Vardeman, Stephen B ^c  

^a UNIVERSITY OF ARKANSAS FOR MEDICAL SCIENCES   (United States)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

Markov Chain Monte Carlo (MCMC); Measurement error; Untested device

Indexed keywords

CALIBRATION; ELECTRIC RESISTANCE; HIERARCHICAL SYSTEMS; MEASUREMENT ERRORS; PARAMETER ESTIMATION; STATISTICAL METHODS;

HIERARCHICAL BAYES; MARKOV CHAIN MONTE CARLO (MCMC); RESISTANCE TEMPERATURE DEVICES (RTD); UNTESTED DEVICES;

BAYESIAN NETWORKS;

EID: 33947316403     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.884128     Document Type: Article

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