Inference on reliability in two-parameter exponential stress-strength model

Metrika

Volumn 65, Issue 3, 2007, Pages 261-273

  Krishnamoorthy, K ^a   Mukherjee, Shubhabrata ^a   Guo, Huizhen ^b  

^a UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

^b XAVIER UNIVERSITY   (United States)

Author keywords

Coverage probability; Generalized confidence limit; Generalized p value; Location scale invariance; Pareto distribution; Power distribution; Size

Indexed keywords

EID: 33947316137     PISSN: 00261335     EISSN: 1435926X     Source Type: Journal    
DOI: 10.1007/s00184-006-0074-7     Document Type: Article

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