A waveguide bridge/quasi-optical W-band spectrometer for dielectric measurement of absorbing materials

2000 25th International Conference on Infrared and Millimeter Waves - Conference Digest

Volumn , Issue , 2000, Pages 393-394

  Afsar, M N ^a   Tkachov, I I ^a   Kocharyan, K N ^a  

^a TUFTS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947306919     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIMW.2000.893075     Document Type: Conference Paper

References (3)

1. M. N. Afsar, K. J. Button, "Millimeter Wave Dielectric Measurement of Materials.", Proceedings of the IEEE, Vol. 73, No. 1, pp. 131-153, January 1985.
2. J.R. Birch, G.J. Simonis, M.N.Afsar, R.N. Clarke, J.M. Dutta, H.M. Frost, X. Gerbaux, A.Hadni, W.F. Hall, Roland Heidinger, W.W. Ho, C.R. Jones, F. Koniger, R.L. Moore, Hiroshi Matsuo, T. Nakano, W. Richter, Kiyomi Sakai, M.R. Stead, U. Stumper, R.S.Vigil, T.B.Wells "An Intercomparison of Measurement Techniques for the Determination of the Dielectric Properties of Solids at Near Millimetre Wavelengths." IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-42, No-6, pp. 956-963, June 1994
3. A.A. Volkov, G.V. Kozlov, A.M. Prokhorov "Progress in submillimeter spectroscopy of solid state" Infrared Physics, Vol. 29. No.2-4 pp. 747-752 1988