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Volumn 101, Issue 5, 2007, Pages

Analysis of electron beam induced deposition (EBID) of residual hydrocarbons in electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM INDUCED DEPOSITION (EBID); PEAK DISSOCIATION; SURFACE TRANSPORT EQUATION (STE);

EID: 33947305605     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2437065     Document Type: Article
Times cited : (56)

References (19)
  • 2
    • 33947317672 scopus 로고    scopus 로고
    • University of Delft
    • N. Silvis-Cividjian, Ph.D. thesis, University of Delft, 2002.
    • (2002)
    • Silvis-Cividjian, N.1
  • 19
    • 33947318896 scopus 로고    scopus 로고
    • Technical Communication with FEI, Inc., the manufacturer of Quanta 200 ESEM.
    • Technical Communication with FEI, Inc., the manufacturer of Quanta 200 ESEM.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.