-
1
-
-
0032657521
-
"4H-SiC visible blind and UV avalanche photodiodes"
-
F. Yan, Y. Luo, J. H. Zhao, and G. H. Olsen, "4H-SiC visible blind and UV avalanche photodiodes," Electron. Lett., vol. 35, no. 11, pp. 929-930, 1999.
-
(1999)
Electron. Lett.
, vol.35
, Issue.11
, pp. 929-930
-
-
Yan, F.1
Luo, Y.2
Zhao, J.H.3
Olsen, G.H.4
-
2
-
-
33947273106
-
"4H-SiC avalanche photodiodes"
-
in San Antonio, TX
-
J. C. Campbell, X. Guo, and A. Beck, "4H-SiC avalanche photodiodes," in Proc. 205th. Mtg. Electrochem. Soc., State-of-the-Art Program on Comp. Semic. XL, and Narrow Bandgap Optoelectronic Mat. and Dev. II, San Antonio, TX.
-
Proc. 205th. Mtg. Electrochem. Soc., State-of-the-Art Program on Comp. Semic. XL, and Narrow Bandgap Optoelectronic Mat. and Dev. II
-
-
Campbell, J.C.1
Guo, X.2
Beck, A.3
-
3
-
-
1842431406
-
"Edge breakdown in 4H-SiC avalanche photodiodes"
-
Mar
-
A. L. Beck, B. Yang, X. Guo, and J. C. Campbell, "Edge breakdown in 4H-SiC avalanche photodiodes," IEEE J. Quantum Electron., vol. 40, no. 3, pp. 321-324, Mar. 2004.
-
(2004)
IEEE J. Quantum Electron.
, vol.40
, Issue.3
, pp. 321-324
-
-
Beck, A.L.1
Yang, B.2
Guo, X.3
Campbell, J.C.4
-
5
-
-
33947212864
-
"High performance ultraviolet 4H-SiC avalanche photodiodes"
-
Ph.D. dissertation, Univ. Texas at Austin, Austin, TX
-
X. Guo, "High performance ultraviolet 4H-SiC avalanche photodiodes," Ph.D. dissertation, Univ. Texas at Austin, Austin, TX, 2005.
-
(2005)
-
-
Guo, X.1
-
6
-
-
26844524747
-
"Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain"
-
Oct
-
X. Guo, A. L. Beck, J. C. Campbell, D. Emerson, and J. Sumakeris, "Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain," IEEE J. Quantum Electron., vol. 41, no. 10, pp. 1213-1216, Oct. 2005.
-
(2005)
IEEE J. Quantum Electron.
, vol.41
, Issue.10
, pp. 1213-1216
-
-
Guo, X.1
Beck, A.L.2
Campbell, J.C.3
Emerson, D.4
Sumakeris, J.5
-
7
-
-
19944431423
-
"Status of 4H-SiC substrate and epitaxial materials for commercial power applications"
-
A. R. Powell, J. J. Sumakeris, R. T. Leonard, M. F. Brady, S. G. Muller, V. F. Tsvetkov, H.M. Hobgood, A. A. Burk, M. J. Paisley, R. C. Glass, and C. H. Carter, Jr., "Status of 4H-SiC substrate and epitaxial materials for commercial power applications," Mat. Res. Soc. Symp. Proc., vol. 815, pp. 3-14, 2004.
-
(2004)
Mat. Res. Soc. Symp. Proc.
, vol.815
, pp. 3-14
-
-
Powell, A.R.1
Sumakeris, J.J.2
Leonard, R.T.3
Brady, M.F.4
Muller, S.G.5
Tsvetkov, V.F.6
Hobgood, H.M.7
Burk, A.A.8
Paisley, M.J.9
Glass, R.C.10
Carter Jr., C.H.11
-
8
-
-
0033079457
-
"Temperature dependence of hole impact ionization coefficients in 4H and 6H SiC"
-
R. Raghunathan and B. J. Baliga, "Temperature dependence of hole impact ionization coefficients in 4H and 6H SiC," Solid-State Electron., vol. 43, pp. 199-211, 1999.
-
(1999)
Solid-State Electron.
, vol.43
, pp. 199-211
-
-
Raghunathan, R.1
Baliga, B.J.2
-
9
-
-
33947234616
-
"Deep centers and negative temperature coefficient of the breakdown voltage of SiC p-n structures"
-
Jul
-
S. Ortoland, C. Raynaud, M. L. Locatelli, D. Planson, and J. P. Chante, "Deep centers and negative temperature coefficient of the breakdown voltage of SiC p - n structures," Fiz. Tekh. Poluprovodn., vol. 31, pp. 886-868, Jul. 1997.
-
(1997)
Fiz. Tekh. Poluprovodn.
, vol.31
, pp. 868-886
-
-
Ortoland, S.1
Raynaud, C.2
Locatelli, M.L.3
Planson, D.4
Chante, J.P.5
-
10
-
-
0027543254
-
"Silicon carbide UV photodiodes"
-
Feb
-
D. M. Brown, E. T. Downey, M. Ghezzo, W. Kretchmer, and R. J. Saia, "Silicon carbide UV photodiodes," IEEE Trans. Electron Devices, vol. 40, no. 2, pp. 325-333, Feb. 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, Issue.2
, pp. 325-333
-
-
Brown, D.M.1
Downey, E.T.2
Ghezzo, M.3
Kretchmer, W.4
Saia, R.J.5
-
11
-
-
84922644221
-
"Multiplication noise in uniform avalanche diodes"
-
Jan
-
R. J. McIntyre, "Multiplication noise in uniform avalanche diodes," IEEE Trans. Electron Devices, vol. ED-13, no. 1, pp. 164-168, Jan. 1966.
-
(1966)
IEEE Trans. Electron Devices
, vol.ED-13
, Issue.1
, pp. 164-168
-
-
McIntyre, R.J.1
-
12
-
-
0000878455
-
"Photoelectrochemical characterization of 6H-SiC"
-
Jun
-
J. van de Lagemaat, D. Vanmaekelbergh, and J. J. Kelly, "Photoelectrochemical characterization of 6H-SiC," J. Appl. Phys., vol. 83, no. 11, pp. 6089-6095, Jun. 1998.
-
(1998)
J. Appl. Phys.
, vol.83
, Issue.11
, pp. 6089-6095
-
-
van de Lagemaat, J.1
Vanmaekelbergh, D.2
Kelly, J.J.3
-
13
-
-
0002622512
-
"Ionization rates and critical fields in 4H silicon carbide"
-
Jul
-
A. O. Konstantinov, Q. Wahab, N. Nordell, and U. Lidefelt, "Ionization rates and critical fields in 4H silicon carbide," Appl. Phys. Lett., vol. 71, no. 7, pp. 90-92, Jul. 1997.
-
(1997)
Appl. Phys. Lett.
, vol.71
, Issue.7
, pp. 90-92
-
-
Konstantinov, A.O.1
Wahab, Q.2
Nordell, N.3
Lidefelt, U.4
|