메뉴 건너뛰기




Volumn 18, Issue 23, 2006, Pages 2508-2510

Demonstration of ultraviolet 6H-SiC PIN avalanche photodiodes

Author keywords

Avalanche photodiode (APD); Impact ionization; Photodetector; Silicon carbide; Ultraviolet (UV)

Indexed keywords

CURRENT DENSITY; ELECTRIC PROPERTIES; IMPACT IONIZATION; OPTICAL GAIN; OPTICAL PROPERTIES; PHOTODETECTORS; ULTRAVIOLET DETECTORS;

EID: 33947255045     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2006.887211     Document Type: Article
Times cited : (26)

References (13)
  • 1
    • 0032657521 scopus 로고    scopus 로고
    • "4H-SiC visible blind and UV avalanche photodiodes"
    • F. Yan, Y. Luo, J. H. Zhao, and G. H. Olsen, "4H-SiC visible blind and UV avalanche photodiodes," Electron. Lett., vol. 35, no. 11, pp. 929-930, 1999.
    • (1999) Electron. Lett. , vol.35 , Issue.11 , pp. 929-930
    • Yan, F.1    Luo, Y.2    Zhao, J.H.3    Olsen, G.H.4
  • 3
    • 1842431406 scopus 로고    scopus 로고
    • "Edge breakdown in 4H-SiC avalanche photodiodes"
    • Mar
    • A. L. Beck, B. Yang, X. Guo, and J. C. Campbell, "Edge breakdown in 4H-SiC avalanche photodiodes," IEEE J. Quantum Electron., vol. 40, no. 3, pp. 321-324, Mar. 2004.
    • (2004) IEEE J. Quantum Electron. , vol.40 , Issue.3 , pp. 321-324
    • Beck, A.L.1    Yang, B.2    Guo, X.3    Campbell, J.C.4
  • 5
    • 33947212864 scopus 로고    scopus 로고
    • "High performance ultraviolet 4H-SiC avalanche photodiodes"
    • Ph.D. dissertation, Univ. Texas at Austin, Austin, TX
    • X. Guo, "High performance ultraviolet 4H-SiC avalanche photodiodes," Ph.D. dissertation, Univ. Texas at Austin, Austin, TX, 2005.
    • (2005)
    • Guo, X.1
  • 6
    • 26844524747 scopus 로고    scopus 로고
    • "Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain"
    • Oct
    • X. Guo, A. L. Beck, J. C. Campbell, D. Emerson, and J. Sumakeris, "Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain," IEEE J. Quantum Electron., vol. 41, no. 10, pp. 1213-1216, Oct. 2005.
    • (2005) IEEE J. Quantum Electron. , vol.41 , Issue.10 , pp. 1213-1216
    • Guo, X.1    Beck, A.L.2    Campbell, J.C.3    Emerson, D.4    Sumakeris, J.5
  • 8
    • 0033079457 scopus 로고    scopus 로고
    • "Temperature dependence of hole impact ionization coefficients in 4H and 6H SiC"
    • R. Raghunathan and B. J. Baliga, "Temperature dependence of hole impact ionization coefficients in 4H and 6H SiC," Solid-State Electron., vol. 43, pp. 199-211, 1999.
    • (1999) Solid-State Electron. , vol.43 , pp. 199-211
    • Raghunathan, R.1    Baliga, B.J.2
  • 9
    • 33947234616 scopus 로고    scopus 로고
    • "Deep centers and negative temperature coefficient of the breakdown voltage of SiC p-n structures"
    • Jul
    • S. Ortoland, C. Raynaud, M. L. Locatelli, D. Planson, and J. P. Chante, "Deep centers and negative temperature coefficient of the breakdown voltage of SiC p - n structures," Fiz. Tekh. Poluprovodn., vol. 31, pp. 886-868, Jul. 1997.
    • (1997) Fiz. Tekh. Poluprovodn. , vol.31 , pp. 868-886
    • Ortoland, S.1    Raynaud, C.2    Locatelli, M.L.3    Planson, D.4    Chante, J.P.5
  • 11
    • 84922644221 scopus 로고
    • "Multiplication noise in uniform avalanche diodes"
    • Jan
    • R. J. McIntyre, "Multiplication noise in uniform avalanche diodes," IEEE Trans. Electron Devices, vol. ED-13, no. 1, pp. 164-168, Jan. 1966.
    • (1966) IEEE Trans. Electron Devices , vol.ED-13 , Issue.1 , pp. 164-168
    • McIntyre, R.J.1
  • 12
    • 0000878455 scopus 로고    scopus 로고
    • "Photoelectrochemical characterization of 6H-SiC"
    • Jun
    • J. van de Lagemaat, D. Vanmaekelbergh, and J. J. Kelly, "Photoelectrochemical characterization of 6H-SiC," J. Appl. Phys., vol. 83, no. 11, pp. 6089-6095, Jun. 1998.
    • (1998) J. Appl. Phys. , vol.83 , Issue.11 , pp. 6089-6095
    • van de Lagemaat, J.1    Vanmaekelbergh, D.2    Kelly, J.J.3
  • 13
    • 0002622512 scopus 로고    scopus 로고
    • "Ionization rates and critical fields in 4H silicon carbide"
    • Jul
    • A. O. Konstantinov, Q. Wahab, N. Nordell, and U. Lidefelt, "Ionization rates and critical fields in 4H silicon carbide," Appl. Phys. Lett., vol. 71, no. 7, pp. 90-92, Jul. 1997.
    • (1997) Appl. Phys. Lett. , vol.71 , Issue.7 , pp. 90-92
    • Konstantinov, A.O.1    Wahab, Q.2    Nordell, N.3    Lidefelt, U.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.