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Volumn 75, Issue 12, 2007, Pages

Control of defect structure in compound semiconductors with stoichiometry: Oxygen in CdTe

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EID: 33947227819     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.125204     Document Type: Article
Times cited : (27)

References (27)
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