Development of a monitoring system for quality prediction in laser marking using fuzzy theory

Journal of Laser Applications

Volumn 19, Issue 1, 2007, Pages 55-63

  Park, Young Whan ^a   Kim, Taehyung ^a   Rhee, Sehun ^a  

^a Hanyang University   (South Korea)

Author keywords

Ablation; Fuzzy inference algorithm; Laser marking; Neural network model; Photodiode; Plasma; Quality prediction; Width estimation

Indexed keywords

CHIP SCALE PACKAGES; FUZZY INFERENCE; LASER ABLATION; LASER PRODUCED PLASMAS; NEURAL NETWORKS; PHOTODIODES; SILICON WAFERS;

COAXIAL MONITORING METHOD; LASER MARKING; LASER MICROMATERIAL PROCESSING;

LASER APPLICATIONS;

EID: 33947226019     PISSN: 1042346X     EISSN: None     Source Type: Journal    
DOI: 10.2351/1.2402519     Document Type: Article

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