Pores and ridges: High-resolution fingerprint matching using level 3 features

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 29, Issue 1, 2007, Pages 15-27

  Jain, Anil K ^a   Chen, Yi ^a   Demirkus, Meltem ^a  

^a Michigan State University   (United States)

Author keywords

Extended feature set; Fingerprint recognition; Hierarchical matching; High resolution fingerprints; Level 3 features; Minutia; Pores; Ridge contours

Indexed keywords

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; IMAGE QUALITY; IMAGE RECOGNITION; IMAGE RESOLUTION; ITERATIVE METHODS; OPTICAL FILTERS; PIXELS; SCANNING; WAVELET TRANSFORMS;

FINGERPRINT RECOGNITION; GABOR FILTERS; ITERATIVE CLOSEST POINT ALGORITHM; MINUTIA POINTS; RIDGE CONTOURS;

IMAGE MATCHING;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; CLUSTER ANALYSIS; COMPUTER ASSISTED DIAGNOSIS; DERMATOGLYPHICS; EVALUATION; FINGER; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SKIN;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; CLUSTER ANALYSIS; DERMATOGLYPHICS; FINGERS; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SKIN;

EID: 33947208338     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2007.250596     Document Type: Article

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