Effects of projectile track charging on the H- secondary ion velocity distribution

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 256, Issue 1, 2007, Pages 483-488

  Iza, P ^a   Farenzena, L S ^a   da Silveira, E F ^a  

^a PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

Energy and angle differential spectrometry; H desorption; Ion solid interaction; Secondary ion emission; SEID; Sputtering; XY TOF

Indexed keywords

DATA REDUCTION; ELECTRIC FIELDS; HYDROGEN; ICE; SECONDARY EMISSION; TARGETS;

ANGLE DIFFERENTIAL SPECTROMETRY; H- DESORPTION; ION SOLID INTERACTION; SECONDARY ELECTRON INDUCED DESORPTION (SEID); SECONDARY ION EMISSIONS;

ION BOMBARDMENT;

EID: 33947173090     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.070     Document Type: Article

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