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Volumn 256, Issue 1, 2007, Pages 520-523

Highly charged ion-induced potential electron emission from clean Au(1 1 1): Dependence on the projectile angle of incidence

Author keywords

Clean surfaces; Electron beam ion trap; Electron emission; Highly charged ions

Indexed keywords

ELECTRON TRAPS; ION BEAMS; ION BOMBARDMENT; TARGETS; VELOCITY;

EID: 33947154685     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.102     Document Type: Article
Times cited : (6)

References (30)
  • 5
    • 33947182649 scopus 로고    scopus 로고
    • P. Sigmund (Ed.), Book Fundamental Processes in Sputtering of Atoms and Molecules (SPUT 92), Mat. Fys. Medd., Copenhagen, 1993.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.