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Volumn 154, Issue 4, 2007, Pages

Microstructural development of copper sulfide on copper exposed to humid H2 S

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION LAYERS; CRITICAL THICKNESS; THICKENING FILM;

EID: 33947148295     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2436612     Document Type: Article
Times cited : (18)

References (16)
  • 14
    • 0003998388 scopus 로고
    • 74 ed., D. R.Lide, Editor, CRC Press, Boca Raton, FL
    • CRC Handbook of Chemistry and Physics, 74 ed., D. R. Lide, Editor, CRC Press, Boca Raton, FL (1994).
    • (1994) CRC Handbook of Chemistry and Physics


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.