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Volumn 154, Issue 4, 2007, Pages
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Microstructural development of copper sulfide on copper exposed to humid H2 S
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Author keywords
[No Author keywords available]
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Indexed keywords
CORROSION LAYERS;
CRITICAL THICKNESS;
THICKENING FILM;
COPPER COMPOUNDS;
ENVIRONMENTAL CHAMBERS;
FOCUSED ION BEAMS;
SCANNING ELECTRON MICROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
X RAY DIFFRACTION;
MICROSTRUCTURE;
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EID: 33947148295
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.2436612 Document Type: Article |
Times cited : (18)
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References (16)
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