Rapid flaw depth estimation from SQUID-based eddy current nondestructive evaluation

NDT and E International

Volumn 40, Issue 4, 2007, Pages 289-293

  Pattabiraman, M ^a   Nagendran, R ^a   Janawadkar, M P ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Eddy current testing; Electromagnetic testing; Finite element analysis; Nondestructive testing; SQUIDs

Indexed keywords

EDDY CURRENT TESTING; EDDY CURRENTS; FINITE ELEMENT METHOD; MAGNETIC FIELD EFFECTS; SQUIDS;

ELECTROMAGNETIC TESTING; FLAW DEPTH ESTIMATION; NONDESTRUCTIVE EVALUATION;

DEFECTS;

EID: 33947126144     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2006.12.003     Document Type: Article

References (10)

1. Tavrin Y., Krause H.-J., Wolf W., Glyantsev V., Schubert J., Zander W., et al. Cryogenics 36 (1996) 83-86
2. Jeng JT. High-Tc dc SQUID and its application to non-destructive evaluation. PhD thesis, Department of Physics, National Taiwan Normal University, Taiwan, 2001. Available on the internet upon (free) registration at 〈http://etds.ncl.edu.tw/theabs/english_site/search_simple_eng.jsp〉.
3. Jeng J.T., Yang S.Y., Horng H.E., and Yang H.C. IEEE Trans Appl Supercond 11 (2001) 1295
4. Jeng J.T., Horng H.E., Yang H.C., Chen J.C., and Chen J.H. Physica C 367 (2002) 298
5. Ma Y.P., and Wikswo Jr. J.P. Rev Prog QNDE 12 (1993) 1137
6. Mück M., Kreutzbruck M.V., Baby U., Tröll J., and Heiden C. Physica C 282 (1997) 407
7. Ida N. Numerical modelling for electromagnetic non-destructive evaluation (1995), Chapman & Hall, London
8. Meeker D. FEMM software package. 〈http://femm.foster-miller.net〉.
9. Lahaye D., De Gersem H., Vandewalle S., and Hameyer K. IEEE Trans Magn 36 (2000) 1535
10. Ma Y.P., and Wikswo Jr. J.P. J Nondestr Eval 14 (1995) 149