Improved Fourier-transform profilometry

Applied Optics

Volumn 46, Issue 5, 2007, Pages 664-668

  Mao, Xianfu ^a   Chen, Wenjing ^a   Su, Xianyu ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; IMAGING SYSTEMS; LENSES; OPTICAL SYSTEMS; PROFILOMETRY;

FOURIER-TRANSFORM PROFILOMETRY; IMAGING LENS; OPTICAL GEOMETRY; PHASE-HEIGHT MAPPING;

GEOMETRICAL OPTICS;

EID: 33947110581     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000664     Document Type: Article

References (11)

1. M. Takeda and K. Mutoh, "Fourier-transform profilometry for the automatic measurement of 3D object shapes," Appl. Opt. 22, 3977-3982 (1983).
2. J. Vanherzeele, P. Guillaume, and S. Vanlanduit, "Fourier fringe processing using a regressive Fourier-transform technique," Opt. Lasers Eng. 43, 645-658 (2005).
3. J. Li, X.-Y. Su, and L.-R. Guo, "Improved Fourier-transform profilometry of the automatic measurement of threedimensional object shapes," Opt. Eng. 29, 1439-1444 (1990).
4. D. Ganotra, J. Joseph, and K. Singh, "Object reconstruction in multilayer neural network based profilometry using grating structure comprising two regions with different spatial periods," Opt. Lasers Eng. 42, 179-192 (2004).
5. J. Zhong and J. Weng, "Phase retrieval of optical fringe patterns from the ridge of a wavelet transform," Opt. Lett. 30, 2560-2562 (2005).
6. X. Su and W. Chen, "Fourier transform profilometry: a review," Opt. Lasers Eng. 35, 263-284 (2001).
7. W.-S. Zhou and X.-Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).
8. G. Schirripa Spagnolo, G. Guattari, C. Sapia, D. Ambrosini, D. Paoletti, and G. Accardo, "Contouring of artwork surface by fringe projection and FFT analysis," Opt. Lasers Eng. 33, 141-156 (2000).
9. K. J. Gåsvik, "Optical techniques," in Interferograms Analysis, D. Robinson and G. T. Reid, eds. (IOP, 1993). pp. 23-71.
10. T. Yatagai, "Intensity based analysis methods," in Interferograms Analysis, D. Robinson and G. T. Reid, eds. (IOP, 1993) pp. 72-93.
11. R.-H. Zheng, Y.-X. Wang, X.-R. Zhang, and Y.-L. Song, "Two-dimensional phase-measuring profilometry," Appl. Opt. 44, 954-958 (2005).