The invisible fray: A critical analysis of the use of reflectometry for fray location

IEEE Sensors Journal

Volumn 6, Issue 3, 2006, Pages 697-706

  Griffiths, Lance Allen ^a,b   Parakh, Rohit ^c   Furse, Cynthia ^a,d,e   Baker, Brittany ^f  

^a IEEE   (United States)

^b L 3 Communications   (United States)

^c CrossRate Technology   (United States)

^d Department of Electrical and Computer Engineering   (United States)

^e LiveWire Test Labs Inc   (United States)

^f MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Fault location; Reflectometry; Spread spectrum reflectometry

Indexed keywords

OPEN CIRCUITS; SPREAD SPECTRUM REFLECTOMETRY; WIRING FAULT;

AIRCRAFT; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC WIRING; SPURIOUS SIGNAL NOISE;

REFLECTOMETERS;

EID: 33947107961     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2006.874017     Document Type: Article

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