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Journal of Applied Physics

Volumn 101, Issue 2, 2007, Pages

Thickness-dependent pinning in a superconductor thin film

(3) Agassi, D a Christen, D K b Pennycook, S J b

a NAVAL SURFACE WARFARE CENTER (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC CONDUCTORS; PENETRATION DEPTH (SUPERCONDUCTIVITY); SCALING LAWS; SUPERCONDUCTING FILMS;

COATED CONDUCTORS; INTERNAL SURFACE; PARAMETER FREE ESTIMATE; SINGLE VORTEX;

THIN FILMS;

EID: 33847765814 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2399898 Document Type: Article

Times cited : (5)

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