The isothermal wafer level test for VLSI interconnect evaluation

1992 International Report on Wafer Level Reliability Workshop, IWLR 1992 - Final Report

Volumn , Issue , 1992, Pages 186-198

  Hijab, Raif S ^a   Yue, John T ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33847760934     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWLR.1992.658004     Document Type: Conference Paper

References (0)