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Volumn 2005, Issue , 2005, Pages 475-478

Three terminal solid-electrolyte nanometer switch

Author keywords

[No Author keywords available]

Indexed keywords

METALLIC BRIDGE; NANOMETER SWITCH; ON/OFF CURRENT RATIO;

EID: 33847756720     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (16)

References (8)
  • 1
    • 2442659934 scopus 로고    scopus 로고
    • Can Solid State Electrochemistry Eliminate the Memory Scaling Quandary?
    • June
    • M. N. Kozicki, et al., "Can Solid State Electrochemistry Eliminate the Memory Scaling Quandary?", in Tech. Dig. of Si Nanoelectronics Workshop, pp. 51-52, June 2002.
    • (2002) Tech. Dig. of Si Nanoelectronics Workshop , pp. 51-52
    • Kozicki, M.N.1
  • 3
    • 0037514404 scopus 로고    scopus 로고
    • Nanometer-scale Switch Using Copper Sulfide
    • May
    • T. Sakamoto, et al., "Nanometer-scale Switch Using Copper Sulfide", Appl. Phys. Lett., Vol. 82, No. 18, pp. 3032-3034, May 2003.
    • (2003) Appl. Phys. Lett , vol.82 , Issue.18 , pp. 3032-3034
    • Sakamoto, T.1
  • 4
    • 11944263858 scopus 로고    scopus 로고
    • A Nonvolatile Programmable Solid-Electrolyte Nanometer Switch
    • Jan
    • S. Kaeriyama, et al., "A Nonvolatile Programmable Solid-Electrolyte Nanometer Switch", IEEE J. of Solid State Circuits, Vol. 40, No. 1, pp. 168-176, Jan. 2005.
    • (2005) IEEE J. of Solid State Circuits , vol.40 , Issue.1 , pp. 168-176
    • Kaeriyama, S.1
  • 5
    • 11944255355 scopus 로고    scopus 로고
    • Quantized conductance atomic switch
    • Jan
    • K. Terabe, et al., "Quantized conductance atomic switch", Nature, Vol. 433, pp. 47-50, Jan. 2005.
    • (2005) Nature , vol.433 , pp. 47-50
    • Terabe, K.1
  • 6
    • 33845570405 scopus 로고    scopus 로고
    • Effect of ion diffusion on switching voltage of solid-electrolyte nanometer switch
    • Sep
    • N. Banno, et al., "Effect of ion diffusion on switching voltage of solid-electrolyte nanometer switch", in Ext. Abs. Int. Conf. Solid State Devices and Materials (SSDM2005), pp. 422-423, Sep. 2005.
    • (2005) Ext. Abs. Int. Conf. Solid State Devices and Materials (SSDM2005) , pp. 422-423
    • Banno, N.1
  • 8
    • 0038493787 scopus 로고    scopus 로고
    • Nanometer-scale resolution of a chloro-methylated calixarene negative resist in electronbeam lithography: Dependence on the number of phenolic residues
    • July
    • T. Sakamoto, et al., "Nanometer-scale resolution of a chloro-methylated calixarene negative resist in electronbeam lithography: Dependence on the number of phenolic residues", Appl. Phys. Lett., Vol. 77, No. 2, pp. 301-303, July 2000.
    • (2000) Appl. Phys. Lett , vol.77 , Issue.2 , pp. 301-303
    • Sakamoto, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.