Photon-assisted tunneling in a carbon nanotube quantum dot

Nano Letters

Volumn 7, Issue 2, 2007, Pages 295-299

  Meyer, Carola ^a,b   Elzerman, Jeroen M ^b,c   Kouwenhoven, Leo P ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EXCITED STATES; MICROWAVE FREQUENCIES; PHOTONS; RESONANCE; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ANALYSIS;

PAT EFFECT; PHOTON-ASSISTED TUNNELING;

CARBON NANOTUBES;

EID: 33847751553     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl062273j     Document Type: Article

References (29)

1. Appenzeller, J.; Frank, D. J. Appl. Phys. Lett. 2004, 84, 1771.
2. Staii, C.; Johnsson, A. T., Jr.; Shao, R.; Bonnell, A. Nano Lett. 2005, 5, 893.
3. Sazonova, V.; Yaish, Y.; Üstünel, H.; Roundy, D.; Arias, T. A.; McEuen, P. L. Nature 2004, 431, 284.
4. Yu, Z.; Burke, P. J. Nano Lett. 2005, 5, 1403.
5. Pesetski, A. A.; Baumgardner, J. E.; Folk, E.; Przybysz, J. X.; Adam, J. D.; Zhang, H. Appl. Phys. Lett. 2006, 88, 113103.
6. Schoelkopf, R. J.; Wahlgren, P.; Kozhevnikov, A. A.; Delsing, P.; Prober, D. E. Science 1998, 280, 1238.
7. Roschier, L.; Sillanpää, M.; Taihong, W.; Ahlskog, M.; Iijima, S.; Hakonen, P. J. Low Temp. Phys. 2004, 136, 465.
8. Li, S.; Yu, Z.; Yen, S.-F.; Tang, W. C.; J. Burke, J. Nano Lett. 2004, 4, 753.
9. Loss, D.; Vincenzo, D. Phys. Rev. A 1998, 57, 120.
10. Hayashi, T.; Fujisawa, T.; Cheaong, H. D.; Jeong, Y. H.; Hirayama, Y. Phys. Rev. Lett. 2003, 91, 226804.
11. Petta, J. R.; Johnson, A. C.; Taylor, J. M.; Laird, E. A.; Yacoby, A.; Lukin, M. D.; Marcus, C. M.; Hanson, M. P.; Gossard, A. C. Science 2005, 309, 2180.
12. Koppens, F. H. L.; Buizert, C.; Tielrooij, K. J.; Vink, I. T.; Nowack, K. C.; Meunier, T.; Kouwenhoven, L. P.; Vandersypen, L. M. K. Nature 2006, 442, 766.
13. Khaetskii, A. V.; Nazarov, Y. V. Phys. Rev. B 2000, 61, 12639.
14. Woods, L. M.; Reinecke, T. L.; Lyanda-Geller, Y. Phys. Rev. B 2002, 66, 161318.
15. Golovach, V. N.; Khaetskii, A.; Loss, D. Phys. Rev. Lett. 2004, 93, 016601.
16. Kong, J.; Soh, H. T.; Cassell, A. M.; Quate, C. F.; Dai, H. Nature 1998, 395, 878.
17. Yang, M. H.; Teo, K. B. K.; Milne, W. I.; Hasko, D. G. Appl. Phys. Lett. 2005, 87, 253116.
18. Kim, W.; Javey, A.; Tu, R.; Cao, J.; Wang, Q.; Dai, H. Appl. Phys. Lett. 2005, 87, 173101.
19. Kouwenhoven, L. P.; Jauhar, S.; McCormick, K.; Dixon, D.; McEuen, P. L.; Nazarov, Yu. V.; van der Vaart, N. C.; Foxon, C. T. Phys. Rev. B 1994, 50, 2019.
20. Oosterkamp, T. H.; Kouwenhoven, L. P.; Koolen, A. E. A.; van der Vaart, N. C.; Harmans, C. J. P. M. Phys. Rev. Lett. 1997, 78, 1536.
21. Kouwenhoven, L. P.; Jauhar, S.; Orenstein, J.; McEuen, P. L.; Nagamune, Y.; Motohisa, J.; Sakaki, H. Phys. Rev. Lett. 1994, 73, 3443.
22. Bruder, C.; Schoeller, H. Phys. Rev. Lett. 1994, 72, 1076.
23. Lemay, S. G.; Janssen, J. W.; van den Hout, M.; Mooij, M.; Bronikowski, J. M.; Willis, P. A.; Smalley, R. E.; Kouwenhoven, L. P.; Dekker, C. Nature 2001, 412, 617.
24. The SMA standard is specified to transmit signals up to 18 GHz, and usually the reflection up to ∼21 GHz is small. Above that, it gets stronger with frequency. Additionally, we have reflection due to the bonding on the chip and also the stripline designed on the chip is not matched to 50 ω. Thus, without measuring the power dependence of the signal, we do not know the amplitude of the signal that actually reaches the device.
25. van der Wiel, W. G.; Oosterkamp, T. H.; De Franceschi, S.; Harmans, C. J. P. M.; Kouwenhoven, L. P. Proceedings of the NATO Advanced Study Institute on Strongly Correlated Fermions and Bosons in Low-Dimensional Disordered Systems, Windsor, U.K. 13-26. August 2001; Lerner, I. V., Althsuler, B. L., Fal'ko, V. I., Giamarchi, T., Eds.; Kluwer Academic Publishers; Dordrecht, 2001; pp 43-68. ISBN 1-4020.-0748-5.
26. Brune, Ph.; Bruder, C.; Schoeller, H. Phys. Rev. B 1997, 56, 4730.
27. Tien, P. K.; Gordon, J. R. Phys. Rev. 1967, 129, 647.
28. Wan, C. J.; McGreer, K. A.; Glazman, L. I.; Goldman, A. M.; Shekther, R. I. Phys. Rev. B 1991, 43, 9381.
29. Oosterkamp, T. H.; Kouwenhoven, L. P.; Koolen, A. E. A.; van der Vaart, N. C.; Harmans, C. J. P. M. Semicond. Sci. Technol. 1996, 11, 1512.