Thermal phenomena in deeply scaled MOSFETs

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 2005, Issue , 2005, Pages 984-987

  Rowlette, Jeremy ^a,c   Pop, Eric ^a   Sinha, Sanjiv ^a,b   Panzer, Mathew ^a   Goodson, Kenneth ^a  

^a Stanford University   (United States)

^b INTEL CORPORATION   (United States)

^c Bldg 530 ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONFINED-GEOMETRY DEVICES; DRIVE CURRENTS; ELECTRO-THERMAL MODELING; THERMAL DESIGN;

HEAT RESISTANCE; LEAKAGE CURRENTS; THERMAL CONDUCTIVITY; THERMAL EFFECTS;

MOSFET DEVICES;

EID: 33847745370     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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