Multiresolution nanoscale sensor-based circuit board testing

AUTOTESTCON (Proceedings)

Volumn 2005, Issue , 2005, Pages 766-772

  Wright, R Glenn ^a   Zgol, Marek ^a   Adebimpe, David ^a   Keenan, Ernest ^a   Mulligan, Robert ^a   Kirkland, Larry V ^b  

^a GMA Industries Inc   (United States)

^b Air Force Materiel Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT (ATE); COMPUTATIONAL CAPABILITIES; ELECTRONIC COMPONENT DEGRADATION; END-TO-END DIAGNOSTIC;

AUTOMATIC TESTING; COMPUTATIONAL METHODS; FAILURE ANALYSIS; NANOTECHNOLOGY; SENSORS;

PRINTED CIRCUIT TESTING;

EID: 33847701316     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2005.1609233     Document Type: Conference Paper

References (5)

1. R.G. Wright, "Functional Circuit Board Testing using Nanoscale Sensors", Autotestcon 2003, Anaheim, CA, September 2003
2. I. G. Hill, A. Rajagopal, A. Kahn and Y. Hu; Appl. Phys. Lett. 73, 662 (1998)
3. M.A. Meitl, et al., Nanoletters 4 (9), 1643-1647, 2004
4. Terahertz Spectroscopy, http://www.nomadics.com/technologies/sensors /thz-spectroscopy/thz-spectroscopy.html
5. G. A. Matzkanin, "Nondestructive characterization of heat damage in graphite/epoxy composites: a state-of-the-art report", http://www.ntiac. com/gamsoar.html (1993)