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Volumn 79, Issue 5, 2007, Pages 2091-2095

Principal component analysis of X-ray diffraction patterns to yield morphological classification of brucite particles

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; CRYSTALLITE SIZE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 33847677231     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac061991n     Document Type: Article
Times cited : (27)

References (33)
  • 25
    • 33847676022 scopus 로고    scopus 로고
    • Statistica version 6.0; StatSoft, Inc, Tulsa, OK, 2004
    • Statistica version 6.0; StatSoft, Inc.: Tulsa, OK, 2004.
  • 30
    • 33847643853 scopus 로고    scopus 로고
    • JCPDS (Joint Committee on Powder Diffraction Standards) standard 7-239.
    • JCPDS (Joint Committee on Powder Diffraction Standards) standard 7-239.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.