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Volumn 32, Issue 4, 2007, Pages 421-423
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Fourier transform emission lifetime spectrometer
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Author keywords
[No Author keywords available]
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Indexed keywords
EXCITATION SPECTRA;
MICHELSON INTERFEROMETER;
WAVELENGTH-DEPENDENT EMISSION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MICHELSON INTERFEROMETERS;
POROUS SILICON;
RUTHENIUM;
SPECTROMETERS;
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EID: 33847674484
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.32.000421 Document Type: Article |
Times cited : (6)
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References (9)
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