A study of low leakage failure mechanism of X7R Multiple Layer Ceramic Capacitor (MLCC)

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2006, Issue , 2006, Pages 142-146

  Zhaofeng, Wang ^a  

^a Failure Analysis Lab   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION PATTERN; MULTIPLE LAYER CERAMIC CAPACITOR (MLCC); THERMAL IMAGING MICROSCOPE;

BARIUM TITANATE; CERAMIC CAPACITORS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FAILURE ANALYSIS; SCANNING ELECTRON MICROSCOPY;

LEAKAGE CURRENTS;

EID: 33847663725     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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3. Y.Kim, C.H.Chen, A.Saiki, N. Wakiya, K.Shinozaki and N. Mizutani "Effect of Nb and Sr doping on Crystal Structure of Epitaxial BaTiO3 Thin Films on MgO Substrate", J. of Phys D: Appl. Phys. 35, 2002 pp1499-1503.
4. D.Thomas, "Interfacial States in Semiconducting BaTiO3", Thomas Research Group http://www.chembio.uoguelph.ca/thomas/batio3_research. html
5. A.R. West, "Solid State Chemistry and Its Application", published by John Wiley and Sons, 1987, pp540-548.