Focused ion beam patterned Hall nano-sensors

Journal of Magnetism and Magnetic Materials

Volumn 310, Issue 2 SUPPL. PART 3, 2007, Pages 2752-2754

  Candini, A ^a,b   Gazzadi, G C ^a   di Bona, A ^a   Affronte, M ^a,b   Ercolani, D ^b,c   Biasiol, G ^c   Sorba, L ^b,c  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c LABORATORIO TASC   (Italy)

Author keywords

Focused ion beam milling; Hall probe; Magnetic sensor; Nano device

Indexed keywords

FOCUSED ION BEAMS; MAGNETIC FLUX; MAGNETOMETERS; SEMICONDUCTOR MATERIALS; SUPERFLUID HELIUM;

FOCUSED ION BEAM MILLING; HALL MAGNETOMETERS; HALL PROBE;

NANOSENSORS;

EID: 33847662488     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.10.1036     Document Type: Article

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