The effect of low temperature annealing on the structure of Gd5Si2Ge2 alloy

Journal of Alloys and Compounds

Volumn 431, Issue 1-2, 2007, Pages 89-92

  Fu, H ^a   Zu, X T ^a,b   He, X ^a   He, W S ^a   Shen, T D ^c  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b INTERNATIONAL CENTRE FOR MATERIALS PHYSICS   (China)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Differential scanning calorimetry; Gd5Si2Ge2 alloy; Magnetocaloric materials; X ray powder diffraction

Indexed keywords

ANNEALING; DIFFERENTIAL SCANNING CALORIMETRY; HEAT TREATMENT; LOW TEMPERATURE EFFECTS; MOLECULAR STRUCTURE; PHASE COMPOSITION; X RAY POWDER DIFFRACTION;

DOUBLE-PHASE STRUCTURE; INNER STRESSES; MAGNETOCALORIC MATERIALS;

GADOLINIUM ALLOYS;

EID: 33847366562     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.05.053     Document Type: Article

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