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Volumn 70, Issue 2, 2007, Pages 290-299
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Examination of the 16O + 28Si system with microscopic and phenomenological potentials
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Author keywords
24.10.Eq; 24.10.Ht; 24.50.+g
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Indexed keywords
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EID: 33847362368
PISSN: 10637788
EISSN: None
Source Type: Journal
DOI: 10.1134/S106377880702010X Document Type: Article |
Times cited : (2)
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References (31)
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