Characterization of the main semiconductor laser static and dynamic working parameters from CW optical spectrum measurements

IEEE Journal of Quantum Electronics

Volumn 43, Issue 2, 2007, Pages 116-122

  Villafranca, Asier ^a   Lasobras, Javier ^a   Lázaro, José A ^b   Garcés, Ignacio ^a  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

Distributed feedback lasers (DFB); Laser measurements; Linewidth enhancement factor; Multiquantum well lasers (MQW); Relative intensity noise (RIN); Semiconductor lasers; Vertical cavity surface emitting lasers (VCSELs)

Indexed keywords

CHARACTERIZATION; DAMPING; DISTRIBUTED FEEDBACK LASERS; LINEWIDTH; SPURIOUS SIGNAL NOISE; SURFACE EMITTING LASERS;

LASER MEASUREMENT; LINEWIDTH ENHANCEMENT FACTOR; MULTIQUANTUM-WELL LASERS; RELATIVE INTENSITY NOISE;

SEMICONDUCTOR LASERS;

EID: 33847359081     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2006.886813     Document Type: Article

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