On classification with incomplete data

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 29, Issue 3, 2007, Pages 427-436

  Williams, David ^a   Liao, Xuejun ^a   Xue, Ya ^a   Carin, Lawrence ^a   Krishnapuram, Balaji ^b  

^a Duke University   (United States)

^b SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

Classification; Imperfect labeling; Incomplete data; Missing data; Semisupervised learning; Supervised learning

Indexed keywords

ALGORITHMS; FEATURE EXTRACTION; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; REGRESSION ANALYSIS; VARIATIONAL TECHNIQUES;

GAUSSIAN MIXTURE MODEL (GMM); IMPERFECT LABELLING; INCOMPLETE DATA; MISSING DATA; SUPERVISED DATA; VARIATIONAL BAYESIAN;

CLASSIFICATION (OF INFORMATION);

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; LOGISTIC MODELS; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY;

EID: 33847348383     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2007.52     Document Type: Article

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