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Volumn 46, Issue 3, 2007, Pages 818-829

Tailored sequence design for third-order volterra model identification

Author keywords

[No Author keywords available]

Indexed keywords

ERROR VARIANCE; RANDOM BINARY SIGNALS (RBS); VOLTERRA KERNELS;

EID: 33847320071     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie0602198     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.