Employing spectra of polycrystalline materials for the verification of optical constants obtained from corresponding low-symmetry single crystals

Applied Optics

Volumn 46, Issue 3, 2007, Pages 327-334

  Mayerhöfer, Thomas G ^a   Popp, Jürgen ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL OSCILLATORS; CRYSTAL STRUCTURE; DISPERSION (WAVES); OPTICAL DESIGN; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX;

AVERAGE REFRACTIVE INDEX THEORY (ARIT); CRYSTAL FACES; CRYSTALLITE SIZE; OPTICAL CONSTANTS; OSCILLATOR STRENGTH;

SINGLE CRYSTALS;

EID: 33847313167     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000327     Document Type: Article

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