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Volumn 2005, Issue , 2005, Pages 720-725

Statistical estimation of phase boundaries and material parameters in industrial process tomography

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; CAPACITANCE; ELECTRIC IMPEDANCE TOMOGRAPHY; FINITE ELEMENT METHOD; FLUID DYNAMICS; IMAGING TECHNIQUES; INDUSTRIAL APPLICATIONS;

EID: 33847305937     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2005.1600730     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 3
    • 0032053399 scopus 로고    scopus 로고
    • A Kalman filter approach to track fast impedance changes in electrical impedance tomography
    • April
    • M. Vauhkonen, P. A. Karjalainen, J. P. Kaipio, "A Kalman filter approach to track fast impedance changes in electrical impedance tomography", IEEE Transactions on Biomedical Engineering, vol. 45, no. 4, April 1998.
    • (1998) IEEE Transactions on Biomedical Engineering , vol.45 , Issue.4
    • Vauhkonen, M.1    Karjalainen, P.A.2    Kaipio, J.P.3
  • 4
    • 3042816350 scopus 로고    scopus 로고
    • Dynamic inverse obstacle problems with electrical impedance tomography
    • K. Y. Kim, B. S. Kim, M. C. Kim, S. Kim, "Dynamic inverse obstacle problems with electrical impedance tomography", Mathematics and Computers in Simulation, vol.66, 2004, pp. 399-408.
    • (2004) Mathematics and Computers in Simulation , vol.66 , pp. 399-408
    • Kim, K.Y.1    Kim, B.S.2    Kim, M.C.3    Kim, S.4
  • 8
    • 16444365978 scopus 로고    scopus 로고
    • Electrical impedance imaging of binary mixtures with boundary estimation approach based on multilayer neural network
    • H. J. Jeon, J. H. Kim, B. Y. Choi, K. Y. Kim, M. C. Kim, S. Kim, "Electrical impedance imaging of binary mixtures with boundary estimation approach based on multilayer neural network", IEEE Sensors Journal, vol.5, no.2, 2005, pp. 313-320.
    • (2005) IEEE Sensors Journal , vol.5 , Issue.2 , pp. 313-320
    • Jeon, H.J.1    Kim, J.H.2    Choi, B.Y.3    Kim, K.Y.4    Kim, M.C.5    Kim, S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.