For better or worse

Chemical and Engineering News

Volumn 85, Issue 7, 2007, Pages 21-34

  Thayer, Ann M ^a  

^a C AND EN   (United States)

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Indexed keywords

EID: 33847282443     PISSN: 00092347     EISSN: 1520605X     Source Type: Trade Journal    
DOI: 10.1021/cen-v085n007.p021     Document Type: Article

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