Analysis of transient grounding resistance under pulsed discharging current

Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM 2003

Volumn , Issue , 2003, Pages 554-557

  He, Hongbing ^a   Zhou, Bihua ^a   Yu, Tongbing ^a   Chen, Jiaqing ^a   Yang, Chunshan ^a   Ren, Hemin ^a  

^a INSTITUTE OF COMMUNICATIONS ENGINEERING   (China)

Author keywords

Finite Difference Time Domain (FDTD) method; Grounding; Transient grounding resistance (TGR)

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; NUMERICAL METHODS; POWER QUALITY; TIME DOMAIN ANALYSIS;

BURIED DEPTH; DISCHARGING CURRENT; GROUND CONDUCTIVITY; GROUNDING CONDUCTORS; TRANSIENT GROUNDING RESISTANCE; TRANSIENT GROUNDING RESISTANCE (TGR);

ELECTRIC GROUNDING;

EID: 33847272535     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEEM.2003.238411     Document Type: Conference Paper

References (6)

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