Structural effect on UV emission properties of high-quality ZnO thin films deposited by RF magnetron sputtering

Physica B: Condensed Matter

Volumn 392, Issue 1-2, 2007, Pages 332-336

  Hsieh, P T ^a   Chen, Y C ^a   Kao, K S ^b   Wang, C M ^c  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b SHU TE UNIVERSITY   (Taiwan)

^c CHENG SHIU UNIVERSITY   (Taiwan)

Author keywords

Photoluminescence; Sputtering; Ultraviolet and Zinc oxide

Indexed keywords

BAND STRUCTURE; CRYSTALLIZATION; LIGHT EMISSION; MAGNETRON SPUTTERING; PHOTOLUMINESCENCE; ULTRAVIOLET RADIATION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

BAND-TO-BAND TRANSITION; OXYGEN CONCENTRATION; SPUTTERING PRESSURE;

THIN FILMS;

EID: 33847272092     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.11.043     Document Type: Article

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