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1
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0038013577
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Solder Joint Behavior of Area Array Packages in Board Level Drop for Handheld Devices
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New Orleans, LA, May
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rd Electronic Components and Technology Conf, New Orleans, LA, May 2003, pp. 130-135.
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(2003)
rd Electronic Components and Technology Conf
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Xie, D.J.1
Arra, M.2
Yi, S.3
Rooney, D.4
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4
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4444260041
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Drop Impact Reliability Analysis of CSP Packages at Board and Product System Levels Through Modeling Approaches
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L. Zhu, W. Marcinkiewicz, "Drop Impact Reliability Analysis of CSP Packages at Board and Product System Levels Through Modeling Approaches", Proc Inter Society Conference on Thermal Phenomena, 2004, pp. 296-303.
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Proc Inter Society Conference on Thermal Phenomena
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Zhu, L.1
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5
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10444248113
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Models for Reliability Prediction of Fine-Pitch BGAs and CSPs in Shock and Drop-Impact
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 1296-1303.
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(2004)
th Electronic Components and Technology Conf
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Lall, P.1
Panchagade, D.2
Liu, Y.3
Johnson, W.4
Suhling, J.5
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4444300233
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The Examination of the Drop Impact Test Method
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Q. Yu, K. Watanabe, T. Tsurusawa, M. Shiratori, "The Examination of the Drop Impact Test Method", Proc Inter Society Conference on Thermal Phenomena, 2004, pp. 336-342.
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Proc Inter Society Conference on Thermal Phenomena
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Yu, Q.1
Watanabe, K.2
Tsurusawa, T.3
Shiratori, M.4
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8
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10444238042
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High Drop Test Reliability: Lead-free Solders
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 1304-1309.
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(2004)
th Electronic Components and Technology Conf
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Amagai, M.1
Toyoda, Y.2
Ohnishi, T.3
Akita, S.4
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9
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10644231004
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Effect of Thermal Aging on Board Level Drop Reliability for Pb-free BGA Packages
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 1256-1262.
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(2004)
th Electronic Components and Technology Conf
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Chiu, T.1
Zeng, K.2
Stierman, R.3
Edwards, D.4
Ano, K.5
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10
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10444257234
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Effect of Intermetallics Phases on Performance in a Mechanical Drop Environment: 96.5Sn3.5Ag Solder on Cu and Ni/Au Pad Finishes
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 1288-1295.
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(2004)
th Electronic Components and Technology Conf
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Sana, S.K.1
Mathew, S.2
Canumalla, S.3
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11
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32844469702
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Drop Impact Test - Mechanics & Physics of Failure
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E.H. Wong, K.M. Lim, N. Lee, S. Seah, C. Hoe, J. Wang, "Drop Impact Test - Mechanics & Physics of Failure", Proc 4 Electronics Packaging Technology Conf, 2002, pp. 327-333.
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Proc 4 Electronics Packaging Technology Conf
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Wong, E.H.1
Lim, K.M.2
Lee, N.3
Seah, S.4
Hoe, C.5
Wang, J.6
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12
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2942740958
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Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test
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July
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T.Y. Tee, H.S. Ng, C.T. Lim, E. Pek, Z.W. Zhong, "Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test", Journal of Microelectronics Reliability, Vol. 44, Issue 7, July 2004, pp. 1131-1142.
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Tee, T.Y.1
Ng, H.S.2
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13
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24644473712
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A Methodology for Drop Performance Prediction and Application for Design Optimization of Chip Scale Packages
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Lake Buena Vista, FL, June
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th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, pp. 472-479.
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(2005)
th Electronic Components and Technology Conf
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Syed, A.1
Kim, S.M.2
Lin, W.3
Khim, J.Y.4
Song, E.S.5
Shin, J.H.6
Panczak, T.7
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14
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24644451676
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Failure-Envelope Approach to Modeling Shock and Vibration Survivability of Electronic and MEMS Packaging
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Lake Buena Vista, FL, June
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th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, pp. 480-490.
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(2005)
th Electronic Components and Technology Conf
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Lall, P.1
Panchagade, D.2
Choudhary, P.3
Suhling, J.4
Gupte, S.5
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15
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24644481526
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Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages
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Lake Buena Vista, FL, June
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th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, pp. 622-629.
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(2005)
th Electronic Components and Technology Conf
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Chong, D.Y.R.1
Ng, K.2
Tan, J.Y.N.3
Low, P.T.H.4
Pang, J.H.L.5
Che, F.X.6
Xiong, B.S.7
Xu, L.8
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16
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0030216469
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Reliability Studies of Surface Mount Solder Joints - Effect of Cu-Sn Intermetallic Compounds
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August
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A.C.K. So, Y.C. Chan, "Reliability Studies of Surface Mount Solder Joints - Effect of Cu-Sn Intermetallic Compounds", IEEE Transactions on CPMT, Part B, Vol. 19, No. 3, August 1996, pp. 661-668.
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So, A.C.K.1
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17
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10444241084
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0.5Cu
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 1338-1346.
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(2004)
th Electronic Components and Technology Conf
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Lee, M.1
Hwang, Y.2
Pecht, M.3
Park, J.4
Kim, Y.5
Liu, W.6
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18
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0142165074
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Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint
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September
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G.Y. Li, B.L. Chen, "Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint", IEEE Transactions on CPT, Vol. 26, No. 3, September 2003, pp. 651-658.
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IEEE Transactions on CPT
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Li, G.Y.1
Chen, B.L.2
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19
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0035248339
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Reliability Studies of uBGA Solder Joints - Effect of Ni-Sn Intermetallic Compound
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February
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Y.C. Chan, P.L. Tu, C.W. Tang, K.C Hung, J.K.L. Lai, "Reliability Studies of uBGA Solder Joints - Effect of Ni-Sn Intermetallic Compound", IEEE Transactions on AP, Vol. 24, No. 1, February 2001, pp. 25-32.
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(2001)
IEEE Transactions on AP
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Chan, Y.C.1
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20
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10444245789
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Intermetallic Morphology and Damage Evolution under Thermomechanical Fatigue of Lead (Pb)-Free Solder Interconnections
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Las Vegas, NV, June
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th Electronic Components and Technology Conf, Las Vegas, NV, June 2004, pp. 726-736.
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(2004)
th Electronic Components and Technology Conf
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Dunford, S.1
Canumalla, S.2
Viswanadham, P.3
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