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Volumn 1, Issue , 2005, Pages 262-269

Drop reliability performance assessment for PCB assemblies of Chip Scale Packages (CSP)

Author keywords

[No Author keywords available]

Indexed keywords

DROP RELIABILITY; LEAD-BASED SOLDER; ORGANIC SOLDERABILITY; SOLDER BALL COMPOSITIONS;

EID: 33847268739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (22)
  • 4
    • 4444260041 scopus 로고    scopus 로고
    • Drop Impact Reliability Analysis of CSP Packages at Board and Product System Levels Through Modeling Approaches
    • L. Zhu, W. Marcinkiewicz, "Drop Impact Reliability Analysis of CSP Packages at Board and Product System Levels Through Modeling Approaches", Proc Inter Society Conference on Thermal Phenomena, 2004, pp. 296-303.
    • (2004) Proc Inter Society Conference on Thermal Phenomena , pp. 296-303
    • Zhu, L.1    Marcinkiewicz, W.2
  • 12
    • 2942740958 scopus 로고    scopus 로고
    • Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test
    • July
    • T.Y. Tee, H.S. Ng, C.T. Lim, E. Pek, Z.W. Zhong, "Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test", Journal of Microelectronics Reliability, Vol. 44, Issue 7, July 2004, pp. 1131-1142.
    • (2004) Journal of Microelectronics Reliability , vol.44 , Issue.7 , pp. 1131-1142
    • Tee, T.Y.1    Ng, H.S.2    Lim, C.T.3    Pek, E.4    Zhong, Z.W.5
  • 16
    • 0030216469 scopus 로고    scopus 로고
    • Reliability Studies of Surface Mount Solder Joints - Effect of Cu-Sn Intermetallic Compounds
    • August
    • A.C.K. So, Y.C. Chan, "Reliability Studies of Surface Mount Solder Joints - Effect of Cu-Sn Intermetallic Compounds", IEEE Transactions on CPMT, Part B, Vol. 19, No. 3, August 1996, pp. 661-668.
    • (1996) IEEE Transactions on CPMT, Part B , vol.19 , Issue.3 , pp. 661-668
    • So, A.C.K.1    Chan, Y.C.2
  • 18
    • 0142165074 scopus 로고    scopus 로고
    • Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint
    • September
    • G.Y. Li, B.L. Chen, "Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint", IEEE Transactions on CPT, Vol. 26, No. 3, September 2003, pp. 651-658.
    • (2003) IEEE Transactions on CPT , vol.26 , Issue.3 , pp. 651-658
    • Li, G.Y.1    Chen, B.L.2
  • 19
    • 0035248339 scopus 로고    scopus 로고
    • Reliability Studies of uBGA Solder Joints - Effect of Ni-Sn Intermetallic Compound
    • February
    • Y.C. Chan, P.L. Tu, C.W. Tang, K.C Hung, J.K.L. Lai, "Reliability Studies of uBGA Solder Joints - Effect of Ni-Sn Intermetallic Compound", IEEE Transactions on AP, Vol. 24, No. 1, February 2001, pp. 25-32.
    • (2001) IEEE Transactions on AP , vol.24 , Issue.1 , pp. 25-32
    • Chan, Y.C.1    Tu, P.L.2    Tang, C.W.3    Hung, K.C.4    Lai, J.K.L.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.