Analysis of hardware concepts for electrical capacitance tomography applications

Proceedings of IEEE Sensors

Volumn 2005, Issue , 2005, Pages 688-691

  Wegleiter, Hannes ^a   Fuchs, Anton ^a   Holler, Gert ^a   Kortschak, Bernhard ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CURRENTS; ELECTRIC NETWORK ANALYSIS; ROBUSTNESS (CONTROL SYSTEMS); SENSORS;

ELECTRICAL CAPACITANCE TOMOGRAPHY; FRONT END CIRCUIT; INPUT STAGE CIRCUIT;

TOMOGRAPHY;

EID: 33847253963     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2005.1597792     Document Type: Conference Paper

References (5)

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2. O. Isaksen, A Review of Reconstruction Techniques for Capacitance Tomography, in: Measurement Science and Technology, vol. 7, 1996, pp. 325-337.
3. A. Gonzalez-Nakazawa, J.C. Gamio, and W. Yang, Transient Processes and Noise in a Tomography System: An Analytical Case Study, in: IEEE Sensors Journal, vol. 5, no. 2, April 2005, pp. 321-329.
4. Baxter Larry K., Capacitive sensors - design and applications, IEEE Press, USA New York, 1997.
5. G. Brasseur, Design rules for robust capacitive sensors, IEEE Transactions on Instrumentation and Measurement 52 1261-1265, August 2003.