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Volumn 2007, Issue 79, 2007, Pages 721-739

Future Directions for Camera Systems in Electron Microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYOELECTRON MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

EID: 33847236528     PISSN: 0091679X     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0091-679X(06)79028-8     Document Type: Review
Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.