Improved free-space S-parameter calibration

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2005, Pages 372-375

  Bartley Jr , Philip G ^a   Begley, Shelley B ^b  

^a Innovative Measurement Solutions Inc   (United States)

^b AGILENT TECHNOLOGIES   (United States)

Author keywords

Calibration; Dielectric; Free space measurements; Material measurement; Network analyzer calibration; Permittivity; S parameters; Time domain gating

Indexed keywords

ERROR COEFFICIENTS; FREE SPACE MEASUREMENT; MATERIAL MEASUREMENT; TIME DOMAIN GATING;

CALIBRATION; ELECTRIC NETWORK ANALYZERS; ERROR ANALYSIS; PERMITTIVITY; TIME DOMAIN ANALYSIS;

SCATTERING PARAMETERS;

EID: 33847216596     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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