Characterizing dynamic and leakage power behavior in flip-flops

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn 2002-January, Issue , 2002, Pages 433-437

  Ramanarayanan, R ^a   Vijaykrishnan, N ^a   Irwin, M J ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Flip flops; Leakage power; Power characterization

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC POWER UTILIZATION;

CMOS TECHNOLOGY; DATA TRANSITION; DYNAMIC POWER CONSUMPTION; FLIP-FLOP DESIGNS; LEAKAGE BEHAVIORS; LEAKAGE POWER; OUTPUT TRANSITION; POWER CHARACTERIZATION;

FLIP FLOP CIRCUITS;

EID: 33847211913     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASIC.2002.1158098     Document Type: Conference Paper

References (8)

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