Microwave dielectric properties of Bi(Nb1-xTax)O 4 ceramics with Cu2V2O7

Ferroelectrics

Volumn 262, Issue 1, 2001, Pages 263-268

  Kim, Eung Soo ^a   Kim, Je Hun ^a   Lee, Ki Gang ^a   Kang, Seung Gu ^a   Kim, Pyung Kyu ^b  

^a Kyonggi University   (South Korea)

^b Korea First Microwave Co Ltd   (South Korea)

Author keywords

Bi(Nb1 xTax)O4; Cu2V 2O7; low temperature sintering; microwave dielectric property

Indexed keywords

BI(NB1-XTAX)O4; COMPOSITION RANGES; CU2V 2O7; DIELECTRIC CONSTANTS; LOW-TEMPERATURE SINTERING; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRIC PROPERTY; RESONANT FREQUENCIES; SINGLE PHASE; SINTERING TEMPERATURES; TA CONTENT; TEMPERATURE COEFFICIENT; X-RAY POWDER DIFFRACTION PATTERN;

DIELECTRIC PROPERTIES; DIFFRACTION; LANTHANUM COMPOUNDS; MICROWAVES; NATURAL FREQUENCIES; TANTALUM; X RAY POWDER DIFFRACTION;

SINTERING;

EID: 33847189912     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190108225160     Document Type: Conference Paper

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